Investigating application faults on embedded devices can be a challenge, and sometimes a post-mortem snapshot of the device under test is necessary. Using WIM (Web Image Monitor) on Ricoh multi-function or print devices it is possible to collect comprehensive trace logs that can be used for this purpose.
- Use a browser to open http://(IPaddress)/web/entry/df/websys/direct/getSysInfo.cgi
- If asked, enter the device admin user name and password
- Specify the date the problem occurred
- Specify number of days for the log data
- Press the Download button
The download of the trace log package may take some minutes, so please be patient. The device panel will show a message that the administrator is collecting device logs along with a progress meter (in percent and in time elapsed).
The resulting file is an encrypted archive. You may compress the archive but do not try to repackage or open it.
You may use the self-serve LogCat utility to decrypt the contents for your own research. See How do I decrypt the device (or trace) logs fetched from WIM? | Ricoh Developer Program (RiDP) (ricoh-ridp.com)
When providing the device logs to RiDP do not decrypt the archive. We need the entire encrypted archive package to investigate device issues.
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LogStoring.160415.pdf (92.19 KB) | 92.19 KB |